Postdoctoral Appointee - X-ray Characterization of Materials for Microelectronics
- Argonne National Laboratory
- Location: Lemont, USA
- Job Number: 7287051 (Ref #: 419096)
- Posting Date: 2 months ago
Job Description
The X-ray Science Division of the Advanced Photon Source (APS) at Argonne National Laboratory is seeking a highly motivated postdoctoral candidate to study the structure-function relationship of materials for microelectronics by utilizing multiple advanced X-ray characterization techniques. This effort is part of the Energy Frontier Research Center'sA Center for Power Electronics Materials and Manufacturing Exploration (APEX)initiative, which aims to expand materials selection and integration for next-generation power electronics.
For further information or questions, please contact Dr. Jessica McChesney atjmcchesn@anl.gov.
Position Requirements
This level of knowledge is typically achieved through a formal education in physics, chemistry, materials science, or a related field at the PhD level with zero to five years of employment experience.
Interest in fundamental materials science and interface science.
General understanding of the principles of X-ray-based techniques (instrumentation, measurements, and interpretation), including but not limited to ARPES, XPS, XAS/XMCD, and X-ray scattering.
Ability to work both independently and collaboratively within a diverse, multidisciplinary team environment.
Exceptional oral and written communication skills, essential for effectively conveying research findings and collaborating within a team.
Commitment to modeling Argonne’s core values: impact, safety, respect, integrity, and teamwork.
Preferred Knowledge, Skills, and Experience
Basic knowledge of a programming language.
Experience with surface science sample preparation techniques.
Experience with general ultra-high vacuum instrumentation.
Job Family
Postdoctoral FamilyJob Profile
Postdoctoral AppointeeWorker Type
Long-Term (Fixed Term)Time Type
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